Invention Grant
- Patent Title: Semiconductor device and method for profiling events in semiconductor device
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Application No.: US15946992Application Date: 2018-04-06
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Publication No.: US10475501B2Publication Date: 2019-11-12
- Inventor: Ho-Yeon Jeon , Ah Chan Kim , Min Joung Lee , Youn-Sik Choi
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2017-0103989 20170817
- Main IPC: G11C7/10
- IPC: G11C7/10 ; G11C11/34 ; H03M9/00 ; G06F13/28 ; G06F11/34

Abstract:
A semiconductor device includes a first serializer configured to collect at least one event in a first domain to generate a first serial data stream and transmit the first serial data stream periodically at a first period, a first de-serializer configured to receive the first serial data stream to restore the first serial data stream into first parallel data streams, the first parallel data stream encoding first parallel data items, a timer configured to provide a clock signal having a second period, a direct memory access (DMA) configured to capture the first parallel data items periodically at a second period using the clock signal to generate capture data items, and a first memory configured to store the capture data items. The addresses of the first memory at which the respective capture data items are stored are arranged in an order that the respective capture data items are captured.
Public/Granted literature
- US20190057733A1 SEMICONDUCTOR DEVICE AND METHOD FOR PROFILING EVENTS IN SEMICONDUCTOR DEVICE Public/Granted day:2019-02-21
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