Invention Grant
- Patent Title: Error detection code hold pattern synchronization
-
Application No.: US16262661Application Date: 2019-01-30
-
Publication No.: US10482921B2Publication Date: 2019-11-19
- Inventor: Stefan Dietrich
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Fletcher Yoder, P.C.
- Main IPC: G11B20/18
- IPC: G11B20/18 ; G11C7/22 ; G11C29/12 ; G11C29/04 ; G11B20/12

Abstract:
A memory system includes a memory device, a command clock (CK_t clock) that provides a first clock signal at a first frequency, and a data path clock (WCK_t clock) that provides a second clock signal at a second frequency different than the first frequency. Data path circuitry is synchronized with the WCK_t clock and provides an error detection code (EDC) hold pattern during an idle state. EDC hold pattern synchronization logic synchronizes a start of transmission of the EDC hold pattern synchronous to the CK_t clock.
Public/Granted literature
- US20190164574A1 ERROR DETECTION CODE HOLD PATTERN SYNCHRONIZATION Public/Granted day:2019-05-30
Information query
IPC分类: