Invention Grant
- Patent Title: Spectral calibration of spectral computed tomography (CT)
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Application No.: US15273043Application Date: 2016-09-22
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Publication No.: US10507005B2Publication Date: 2019-12-17
- Inventor: Yannan Jin , Geng Fu , Peter M. Edic , Hewei Gao
- Applicant: GENERAL ELECTRIC COMPANY
- Applicant Address: US NY Schenectady
- Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee Address: US NY Schenectady
- Main IPC: A61B6/03
- IPC: A61B6/03 ; A61B6/00 ; G01T7/00 ; G01N23/046 ; G06T11/00 ; G01T1/169

Abstract:
There is set forth herein a method including performing with an X-ray detector array of a CT imaging system one or more calibration scans, wherein the one or more calibration scans include obtaining for each element of the first through Nth elements of the X-ray detector array one or more calibration measurements; and updating a spectral response model for each element of the first through Nth elements using the one or more calibration measurements. In another aspect, a CT imaging system can perform imaging, e.g. including material decomposition (MD) imaging, using updated spectral response models for elements of an X-ray detector array. The spectral response models can be updated using a calibration process so that different elements of an X-ray detector array have different spectral response models.
Public/Granted literature
- US20180078233A1 SPECTRAL CALIBRATION OF SPECTRAL COMPUTED TOMOGRAPHY (CT) Public/Granted day:2018-03-22
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