Invention Grant
- Patent Title: Image inspection apparatus and image inspection method
-
Application No.: US15955735Application Date: 2018-04-18
-
Publication No.: US10508994B2Publication Date: 2019-12-17
- Inventor: Daisuke Ando
- Applicant: Keyence Corporation
- Applicant Address: JP Osaka
- Assignee: Keyence Corporation
- Current Assignee: Keyence Corporation
- Current Assignee Address: JP Osaka
- Agency: Kilyk & Bowersox, P.L.L.C.
- Priority: JP2017-108095 20170531
- Main IPC: G01N21/88
- IPC: G01N21/88 ; G01N21/55 ; G01N21/01 ; H04N7/12 ; G06T7/00

Abstract:
An image inspection apparatus includes an illuminating section for irradiating illumination light, a line camera in which a plurality of imaging elements are arrayed to be linearly arranged, the line camera receiving the light irradiated from the illuminating section and reflected on the inspection target object, a display section for displaying an image captured by the line camera, an optical axis adjusting section for adjusting an optical axis of the line camera, a trigger setting section for specifying a trigger that specifies timing when the inspection target object is imaged by the line camera, an aspect ratio adjusting section for adjusting longitudinal and lateral pixel resolutions of the image captured by the line camera, and a display control section for displaying the optical axis adjusting section, the trigger setting section, and the aspect ratio adjusting section on the display section in order.
Public/Granted literature
- US20180348144A1 Image Inspection Apparatus And Image Inspection Method Public/Granted day:2018-12-06
Information query