Invention Grant
- Patent Title: Electroencephalogram analysis apparatus and electroencephalogram analysis method
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Application No.: US15938144Application Date: 2018-03-28
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Publication No.: US10517501B2Publication Date: 2019-12-31
- Inventor: Yusaku Nakashima , Takashi Tomita , Masaki Nishida
- Applicant: SONY CORPORATION
- Applicant Address: JP Tokyo
- Assignee: SONY CORPORATION
- Current Assignee: SONY CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Chip Law Group
- Priority: JP2012-086588 20120405
- Main IPC: A61B5/0476
- IPC: A61B5/0476 ; A61B5/048 ; A61B5/16 ; A61B5/00 ; A61B5/04 ; A61B5/0488

Abstract:
An electroencephalogram analysis apparatus includes an electroencephalogram acquisition part and a comparison part. The electroencephalogram acquisition part is configured to acquire a first electroencephalogram measured at a first region on a head of a test subject and a second electroencephalogram measured at a second region positioned behind the first region on the head of the test subject. The comparison part is configured to compare a power of the first electroencephalogram in a specific frequency band with a power of the second encephalogram in the specific frequency band.
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