Invention Grant
- Patent Title: Device and method for image reconstruction at different X-ray energies, and device and method for X-ray three-dimensional measurement
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Application No.: US15674396Application Date: 2017-08-10
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Publication No.: US10521936B2Publication Date: 2019-12-31
- Inventor: Akira Monkawa , Shoichi Nakanishi , Shinya Abe , Mikiya Kondo , Koh Harada
- Applicant: TOKYO METROPOLITAN INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Applicant Address: JP Tokyo
- Assignee: TOKYO METROPOLITAN INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee: TOKYO METROPOLITAN INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee Address: JP Tokyo
- Agency: Sheppard, Mullin, Richter & Hampton LLP
- Priority: JP2013-113498 20130529
- Main IPC: G06T11/00
- IPC: G06T11/00 ; H04N13/156 ; H04N13/204 ; G01B15/04 ; G01N23/046 ; G06K9/52 ; G06T7/00 ; H04N5/232

Abstract:
The present invention provides a device and a method for image reconstruction at different X-ray energies that make it possible to achieve image reconstruction with higher accuracy. A device for image reconstruction at different X-ray energies includes: an X-ray source 1 that irradiates a specimen to be imaged 2 with X-rays; an energy-dispersive detector 4 that detects a characteristic X-ray emitted from the specimen to be imaged 2; a signal processing means that quantifies the peak of the characteristic X-ray detected by the detector 4; and an image reconstruction means that reconstructs an image on the basis of a signal from the signal processing means.
Public/Granted literature
Information query
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06T | 一般的图像数据处理或产生 |
G06T11/00 | 2D〔二维〕图像的生成 |