Invention Grant
- Patent Title: Noise source analysis method
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Application No.: US15566114Application Date: 2015-05-29
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Publication No.: US10527664B2Publication Date: 2020-01-07
- Inventor: Shigehiko Matsuda , Norihiro Suzuki , Noriyuki Maehata
- Applicant: TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Applicant Address: JP Chuo-ku
- Assignee: TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Current Assignee: TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Current Assignee Address: JP Chuo-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- International Application: PCT/JP2015/065604 WO 20150529
- International Announcement: WO2016/194058 WO 20161208
- Main IPC: G01R29/26
- IPC: G01R29/26 ; G01R29/08
Abstract:
The present application provides a noise source analysis method including measuring a noise using voltage sensors 2a and 2b which are time-synchronized with each other and making an analysis to identify a noise source which is a cause of noise based on data of the noise measured by the voltage sensors 2a and 2b.
Public/Granted literature
- US20180095120A1 NOISE SOURCE ANALYSIS METHOD Public/Granted day:2018-04-05
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