- Patent Title: Analysis device, microscope device, analysis method, and program
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Application No.: US16239827Application Date: 2019-01-04
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Publication No.: US10527838B2Publication Date: 2020-01-07
- Inventor: Ichiro Sase
- Applicant: NIKON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: NIKON CORPORATION
- Current Assignee: NIKON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2013-200705 20130927
- Main IPC: G02B21/36
- IPC: G02B21/36 ; G02B21/16 ; G02B27/56 ; G02B27/58 ; G01N21/64 ; G06T7/11 ; G06T7/90
Abstract:
An analysis device for quantifying a state of a fluorescent image containing a plurality of bright spots comprises an area setting unit in which states of a plurality of bright spots contained in a plurality of areas set in the fluorescent image in accordance with positions of the plurality of bright spots are quantified as numerical values.
Public/Granted literature
- US20190137754A1 ANALYSIS DEVICE, MICROSCOPE DEVICE, ANALYSIS METHOD, AND PROGRAM Public/Granted day:2019-05-09
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