Invention Grant
- Patent Title: Platform, systems, and methods for identifying property characteristics and property feature maintenance through aerial imagery analysis
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Application No.: US15714376Application Date: 2017-09-25
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Publication No.: US10529029B2Publication Date: 2020-01-07
- Inventor: Takeshi Okazaki
- Applicant: Aon Benfield Inc.
- Applicant Address: US IL Chicago
- Assignee: Aon Benfield Inc.
- Current Assignee: Aon Benfield Inc.
- Current Assignee Address: US IL Chicago
- Agency: Gardella Grace P.A.
- Main IPC: G06Q40/00
- IPC: G06Q40/00 ; G06Q40/08 ; G06N3/04 ; G06N3/08 ; G06K9/62 ; G06K9/00 ; G06T11/60 ; G06F16/51 ; G06K9/46

Abstract:
In an illustrative embodiment, methods and systems for automatically categorizing a repair condition of a property characteristic may include obtaining aerial imagery of a geographic region including the property, identifying features of the aerial imagery corresponding to the property characteristic, analyzing the features to determine a property characteristic classification, and analyzing a region of the aerial imagery including the property characteristic to determine a condition classification. The methods and systems may further include determining, using the property characteristic classification and the condition classification, a risk estimate of damage to the property due to one or more disasters and/or a cost estimate of repair or replacement of the property characteristic.
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