Invention Grant
- Patent Title: Semiconductor apparatus and system relating to performing a high speed test in a low speed operation environment
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Application No.: US16039112Application Date: 2018-07-18
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Publication No.: US10529437B2Publication Date: 2020-01-07
- Inventor: Soo Young Jang , Jin Youp Cha
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si, Gyeonggi-do
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Icheon-si, Gyeonggi-do
- Agency: William Park & Associates Ltd.
- Priority: KR10-2017-0176622 20171221
- Main IPC: G11C29/12
- IPC: G11C29/12 ; G11C11/34 ; G11C29/18 ; G11C29/56 ; G01R31/26 ; G11C29/44

Abstract:
A system may include a first semiconductor apparatus and a second semiconductor apparatus. Each of the first and second semiconductor apparatuses may receive reference data and a first clock signal. The first semiconductor apparatus may generate a first internal clock signal from the first clock signal, and may output the reference data as transmission data based on the first internal clock signal. The second semiconductor apparatus may generate a second internal clock signal from the first clock signal, and may receive the transmission data based on the second internal clock signal. The second semiconductor apparatus may generate an error detection signal based on the received data and the reference data.
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