Invention Grant
- Patent Title: On-the-fly bit failure detection and bit redundancy remapping techniques to correct for fixed bit defects
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Application No.: US15792672Application Date: 2017-10-24
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Publication No.: US10529439B2Publication Date: 2020-01-07
- Inventor: Neal Berger , Benjamin Louie , Mourad El-Baraji , Lester Crudele
- Applicant: SPIN MEMORY, Inc.
- Applicant Address: US CA Fremont
- Assignee: Spin Memory, Inc.
- Current Assignee: Spin Memory, Inc.
- Current Assignee Address: US CA Fremont
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G11C29/00 ; G11C11/16 ; G06F11/07 ; G11C29/12 ; G11C29/42 ; G11C29/44 ; G11C29/50

Abstract:
A method for correcting bit defects in an STT-MRAM memory is disclosed. The method comprises executing a read before write operation in the STT-MRAM memory, wherein the STT-MRAM memory comprises a plurality of codewords, wherein each codeword comprises a plurality of redundant bits. The read before write operation comprises reading a codeword and mapping defective bits in the codeword. Further, the method comprises replacing the defective bits in the codeword with a corresponding redundant bit and executing a write operation with corresponding redundant bits in place of the defective bits.
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