Invention Grant
- Patent Title: X-ray source for ionizing of gases
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Application No.: US15552388Application Date: 2016-02-24
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Publication No.: US10529527B2Publication Date: 2020-01-07
- Inventor: Thomas Sebald
- Applicant: ESTION TECHNOLOGIES GMBH
- Applicant Address: DE Griesheim
- Assignee: ESTION TECHNOLOGIES GMBH
- Current Assignee: ESTION TECHNOLOGIES GMBH
- Current Assignee Address: DE Griesheim
- Agency: Heslin Rothenberg Farley and Mesiti PC
- Agent Nicholas Mesiti
- Priority: DE102015102612 20150224
- International Application: PCT/DE2016/100081 WO 20160224
- International Announcement: WO2016/134701 WO 20160901
- Main IPC: H01J35/06
- IPC: H01J35/06 ; H01J35/18

Abstract:
An X-ray source for ionizing of gases includes a field emission tip array within a vacuum region enclosed by a hood and a part of a support plate. The field emission tip array is arranged electrically insulated with respect to the carrier plate and wired as a cathode connected to a high-voltage source. A transmission window transparent to X-ray radiation is arranged in the hood centrally above the field emission tip array, and the hood is wired as an anode.
Public/Granted literature
- US20180247785A1 X-RAY SOURCE FOR IONIZING OF GASES Public/Granted day:2018-08-30
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