Invention Grant
- Patent Title: Method of manufacturing semiconductor device, substrate processing apparatus and recording medium
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Application No.: US15926509Application Date: 2018-03-20
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Publication No.: US10529560B2Publication Date: 2020-01-07
- Inventor: Takahiro Miyakura , Atsushi Moriya , Naoharu Nakaiso , Kensuke Haga
- Applicant: HITACHI KOKUSAI ELECTRIC INC.
- Applicant Address: JP Tokyo
- Assignee: Kokusai Electric Corporation
- Current Assignee: Kokusai Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Volpe and Koenig, P.C.
- Priority: JP2017-056142 20170322
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L21/67 ; H01L21/306 ; H01L21/3065 ; H01L21/3213

Abstract:
There is provided a technique that includes (a) pre-etching a surface of a substrate made of single crystal silicon by supplying a first etching gas to the substrate; (b) forming a silicon film on the substrate with the pre-etched surface, by supplying a first silicon-containing gas to the substrate; (c) etching a portion of the silicon film by supplying a second etching gas, which has a different molecular structure from a molecular structure of the first etching gas, to the substrate; and (d) forming an additional silicon film on the etched silicon film by supplying a second silicon-containing gas to the substrate.
Public/Granted literature
- US20180277364A1 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING APPARATUS AND RECORDING MEDIUM Public/Granted day:2018-09-27
Information query
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