Invention Grant
- Patent Title: Damaging components with defective electrical couplings
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Application No.: US16128353Application Date: 2018-09-11
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Publication No.: US10529632B2Publication Date: 2020-01-07
- Inventor: Darrell D. Truhitte , James P. Letterman, Jr.
- Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Applicant Address: US AZ Phoenix
- Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Current Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Current Assignee Address: US AZ Phoenix
- Agency: Adam R. Stephenson, Ltd.
- Main IPC: H01L21/66
- IPC: H01L21/66 ; H01L21/268 ; H01L23/00
Abstract:
A method, in some embodiments, comprises: providing a component having first and second electrical nodes; determining that the component lacks multiple, functional electrical couplings between said first and second nodes; damaging at least part of the component as a result of said determination; and determining, as a result of said damage, that the component is defective.
Public/Granted literature
- US20190013249A1 DAMAGING COMPONENTS WITH DEFECTIVE ELECTRICAL COUPLINGS Public/Granted day:2019-01-10
Information query
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