Invention Grant
- Patent Title: Methods and systems for scheduling of sensing platform nodes
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Application No.: US15562429Application Date: 2015-08-03
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Publication No.: US10531049B2Publication Date: 2020-01-07
- Inventor: Hanno Hildmann , Miquel Martin Lopez
- Applicant: NEC EUROPE LTD.
- Applicant Address: JP Tokyo
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: EP15162087 20150331
- International Application: PCT/EP2015/067850 WO 20150803
- International Announcement: WO2016/155844 WO 20161006
- Main IPC: H04N7/18
- IPC: H04N7/18 ; G06K9/00 ; H04Q9/00 ; H04N5/232

Abstract:
A method for observing a predetermined monitoring area, wherein one or more sensing platform nodes are employed to observe a predetermined number of sub-areas of the monitoring area, includes observing the sub-areas of the monitoring area using the sensing platform nodes so as to collect measuring data for the sub-areas. A prediction model is provided for analyzing predictability of measuring data for the sub-areas based on the collected measuring data. Future measuring data is calculated for the sub-areas and uncertainty of the future measuring data over time is calculated using the prediction model. The sensing platform nodes are scheduled for observation of the sub-areas according to a scheduling mechanism. The scheduling of the sensing platform nodes is dependent on the calculated uncertainty of the future measuring data predicted for the sub-areas.
Public/Granted literature
- US20180091777A1 METHOD AND SYSTEM FOR OBSERVING A PREDETERMINED MONITORING AREA Public/Granted day:2018-03-29
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