Invention Grant
- Patent Title: Apparatus and method for determining a state parameter of an object to be monitored
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Application No.: US14585389Application Date: 2014-12-30
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Publication No.: US10532617B2Publication Date: 2020-01-14
- Inventor: Christoph Steiner , Dirk Hammerschmidt
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Eschweiler & Potashnik, LLC
- Priority: DE102004010665 20040304
- Main IPC: B60C23/04
- IPC: B60C23/04

Abstract:
An apparatus for determining a state parameter of an object to be monitored comprises a means for providing a plurality of measurement values, wherein the measurement values comprise information relating to the state parameter of the object to be monitored, a comparison means for comparing the measurement value to a predeterminable comparison parameter, wherein the comparison means is formed to output a first comparison signal when a predeterminable number of measurement values falls below the comparison parameter within a measurement interval, or to output a second comparison signal when the predeterminable number of measurement values exceeds or reaches the comparison parameter, wherein the first comparison signal or the second comparison signal indicate the state parameter.
Public/Granted literature
- US20150116105A1 Apparatus and Method for Determining a State Parameter of an Object to be Monitored Public/Granted day:2015-04-30
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