Invention Grant
- Patent Title: Method and examination system for examining and processing a microscopic sample
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Application No.: US15574492Application Date: 2016-05-20
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Publication No.: US10533931B2Publication Date: 2020-01-14
- Inventor: Falk Schlaudraff , Blagovesta Wegner
- Applicant: Leica Microsystems CMS GmbH
- Applicant Address: DE Wetzlar
- Assignee: LEICA MICROSYSTEMS CMS GMBH
- Current Assignee: LEICA MICROSYSTEMS CMS GMBH
- Current Assignee Address: DE Wetzlar
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: DE102015108017 20150520
- International Application: PCT/EP2016/061494 WO 20160520
- International Announcement: WO2016/185040 WO 20161124
- Main IPC: G01N1/28
- IPC: G01N1/28 ; G02B21/36 ; G06T7/73 ; G02B21/34

Abstract:
A method for examining and processing a microscopic sample arranged on a slide includes producing reference markings on the slide by a laser beam of a laser microdissection system. A digital image of the sample and the reference markings on the slide is produced by a digital optical imaging device. An image region is defined and first position information data which indicate a position of the image region is generated. The reference markings are identified in the image and second position information data which indicate a position of the reference markings in the image is generated. The reference markings are identified, and third position information data which indicate the position of the reference markings in the laser microdissection system is generated. The first, second and third position information data are correlated and a sample region which corresponds to the image region is processed.
Public/Granted literature
- US20180149561A1 METHOD AND EXAMINATION SYSTEM FOR EXAMINING AND PROCESSING A MICROSCOPIC SAMPLE Public/Granted day:2018-05-31
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