Invention Grant
- Patent Title: Test strip, inspection system and inspection method thereof
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Application No.: US15256638Application Date: 2016-09-05
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Publication No.: US10533993B2Publication Date: 2020-01-14
- Inventor: Cheng-Hao Ko
- Applicant: Cheng-Hao Ko
- Agency: David and Raymond Patent Firm
- Agent Raymond Y. Chan
- Main IPC: G01N33/52
- IPC: G01N33/52 ; G01N21/29 ; G01N21/78 ; G01N21/27

Abstract:
The invention provides a test strip comprising an identification region coded a screen function of the test strip by a chromaticity coordinates model; a calibration region having a particular color for calibrating an external spectrum analyzer; and a reaction region chemically reacted with a specific specimen for changing its own color. By using the external spectrum analyzer to conduct light splitting of the reflective lights from the recognition and reaction regions of the test strip, automatic recognition and simplified usage can be achieved.
Public/Granted literature
- US20180067105A1 Test strip, system and method of inspection Public/Granted day:2018-03-08
Information query
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