Invention Grant
- Patent Title: Resistance change memory device
-
Application No.: US15942236Application Date: 2018-03-30
-
Publication No.: US10535818B2Publication Date: 2020-01-14
- Inventor: Tae Jung Ha
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon
- Assignee: SK HYNIX INC.
- Current Assignee: SK HYNIX INC.
- Current Assignee Address: KR Icheon
- Priority: KR10-2017-0086682 20170707
- Main IPC: G11C11/16
- IPC: G11C11/16 ; H01L45/00 ; G11C13/00

Abstract:
A resistance change memory device is provided. The resistance change memory device includes a lower electrode, a tunneling barrier layer disposed on the lower electrode, a resistance switching layer disposed on the tunneling barrier layer, an oxygen vacancy reservoir layer disposed on the resistance switching layer, and an upper electrode disposed on the oxygen vacancy reservoir layer. The oxygen vacancy reservoir layer is electrically conductive.
Public/Granted literature
- US20190013465A1 RESISTANCE CHANGE MEMORY DEVICE Public/Granted day:2019-01-10
Information query