Invention Grant
- Patent Title: Semiconductor device
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Application No.: US15518189Application Date: 2015-09-18
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Publication No.: US10536141B2Publication Date: 2020-01-14
- Inventor: Shigenobu Komatsu , Kentarou Miyajima , Hiroshi Onuki , Junji Onozuka
- Applicant: Hitachi Automotive Systems, Ltd.
- Applicant Address: JP Hitachinaka-shi
- Assignee: Hitachi Automotive Systems, Ltd.
- Current Assignee: Hitachi Automotive Systems, Ltd.
- Current Assignee Address: JP Hitachinaka-shi
- Agency: Crowell & Moring LLP
- Priority: JP2014-216815 20141024
- International Application: PCT/JP2015/076599 WO 20150918
- International Announcement: WO2016/063666 WO 20160428
- Main IPC: H03L7/00
- IPC: H03L7/00 ; H03K17/22 ; G06F1/30 ; G06F1/24

Abstract:
The purpose of the present invention is to provide a semiconductor device that is small and has diagnosability, and that can quickly recover from power source malfunctions. Provided is a semiconductor device that includes: a control signal generation circuit that generates control signals which differ according to the fluctuation time of power-source voltage; and a control circuit that changes an operation sequence according to the differences in the control signals.
Public/Granted literature
- US20180241388A1 Semiconductor Device Public/Granted day:2018-08-23
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