Invention Grant
- Patent Title: Sensor based auto-calibration wafer
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Application No.: US15591694Application Date: 2017-05-10
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Publication No.: US10537997B2Publication Date: 2020-01-21
- Inventor: Narayanan Ramachandran , Karthik Narayanan Balakrishnan , Rajkumar Thanu , Jeffrey Hudgens
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: APPLIED MATERIALS, INC.
- Current Assignee: APPLIED MATERIALS, INC.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson + Sheridan LLP
- Main IPC: B25J9/16
- IPC: B25J9/16 ; H01L21/67 ; H01L21/687 ; B25J13/08 ; B25J19/02

Abstract:
Embodiments described herein generally relate to an apparatus and method of performing a robot calibration process within a substrate processing system. In one embodiment, a calibration device is used to calibrate a robot having an end effector. The calibration device includes a body, a first side and a second side opposite to the first side. The calibration device further includes a sensor disposed on the second side of the body. In some embodiments, the sensor covers the entire second side of the body. In this configuration, because the sensor covers the entire second side of the body of the calibration device, the calibration device can be utilized to sense the contact between the sensor and various differently configured chamber components found in different types of processing chambers or stations disposed within a processing system during a calibration process performed in each of the different processing chambers or stations.
Public/Granted literature
- US20170326733A1 SENSOR BASED AUTO-CALIBRATION WAFER Public/Granted day:2017-11-16
Information query
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