• Patent Title: Abnormality detection apparatus, abnormality detection method, and non-transitory computer-readable medium
  • Application No.: US15553435
    Application Date: 2016-02-17
  • Publication No.: US10539468B2
    Publication Date: 2020-01-21
  • Inventor: Takehiko Mizoguchi
  • Applicant: NEC CORPORATION
  • Applicant Address: JP Tokyo
  • Assignee: NEC CORPORATION
  • Current Assignee: NEC CORPORATION
  • Current Assignee Address: JP Tokyo
  • Agency: Young & Thompson
  • Priority: JP2015-034631 20150225
  • International Application: PCT/JP2016/000827 WO 20160217
  • International Announcement: WO2016/136198 WO 20160901
  • Main IPC: G06F17/18
  • IPC: G06F17/18 G01K3/10 G06F17/15
Abnormality detection apparatus, abnormality detection method, and non-transitory computer-readable medium
Abstract:
A system monitoring apparatus has: a determination unit for determining whether the relatedness indicating a relationship that is true for first time-series data of multiple sets measured during a first time period is true for second time-series data of the multiple sets measured during a second time period; an irregularity degree calculation unit for calculating the degree of irregularity indicating the extent to which the second time-series data is irregular; a first extent calculation unit for calculating a first extent indicating the extent to which the irregularity is at a specified value when the second time-series data are normal or irregular; a second extent calculation unit for calculating a second extent indicating the extent to which the second time-series data of the multiple sets are related; and a state calculation unit for finding whether the second time-series data are normal or irregular, based on the first and second extents.
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