Invention Grant
- Patent Title: Abnormality detection apparatus, abnormality detection method, and non-transitory computer-readable medium
-
Application No.: US15553435Application Date: 2016-02-17
-
Publication No.: US10539468B2Publication Date: 2020-01-21
- Inventor: Takehiko Mizoguchi
- Applicant: NEC CORPORATION
- Applicant Address: JP Tokyo
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Young & Thompson
- Priority: JP2015-034631 20150225
- International Application: PCT/JP2016/000827 WO 20160217
- International Announcement: WO2016/136198 WO 20160901
- Main IPC: G06F17/18
- IPC: G06F17/18 ; G01K3/10 ; G06F17/15

Abstract:
A system monitoring apparatus has: a determination unit for determining whether the relatedness indicating a relationship that is true for first time-series data of multiple sets measured during a first time period is true for second time-series data of the multiple sets measured during a second time period; an irregularity degree calculation unit for calculating the degree of irregularity indicating the extent to which the second time-series data is irregular; a first extent calculation unit for calculating a first extent indicating the extent to which the irregularity is at a specified value when the second time-series data are normal or irregular; a second extent calculation unit for calculating a second extent indicating the extent to which the second time-series data of the multiple sets are related; and a state calculation unit for finding whether the second time-series data are normal or irregular, based on the first and second extents.
Public/Granted literature
Information query