Invention Grant
- Patent Title: Computed tomographic system calibration
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Application No.: US15941310Application Date: 2018-03-30
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Publication No.: US10539515B2Publication Date: 2020-01-21
- Inventor: Andreas Fischer , Nils Rothe , Alexander Suppes , Eugen Trapet
- Applicant: GE Inspection Technologies, LP
- Applicant Address: US PA Lewistown
- Assignee: GE Inspection Technologies, LP
- Current Assignee: GE Inspection Technologies, LP
- Current Assignee Address: US PA Lewistown
- Agency: Mintz Levin Cohn Ferris Glovsky and Popeo, P.C.
- Main IPC: G01N23/046
- IPC: G01N23/046 ; G01T7/00

Abstract:
Method and apparatus are provided for calibration or verification of accuracy specification of a computed tomographic system. In one embodiment, the apparatus can include a base structure, a first set of test objects arranged along a first axis and coupled to the base structure, and a second set of test objects arranged along a second axis and coupled to the base structure. The first set of test objects and the second set of test objects have a first geometry. The apparatus can also include a third set of test objects and a fourth set of test objects. The third set of test objects, and the fourth set of test objects have a second geometry different from the first geometry. Locations of the first, second third and fourth set of test objects are spatially fixed with respect to the base structure. The apparatus is a test specimen adapted for calibration or accuracy verification of computed tomography system.
Public/Granted literature
- US20190302036A1 COMPUTED TOMOGRAPHIC SYSTEM CALIBRATION Public/Granted day:2019-10-03
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