Invention Grant
- Patent Title: Substrate for sample analysis, sample analysis device, sample analysis system, and method for removing liquid from liquid that contains magnetic particles
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Application No.: US15323007Application Date: 2015-06-29
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Publication No.: US10539582B2Publication Date: 2020-01-21
- Inventor: Fusatoshi Okamoto , Masahiro Johno
- Applicant: PHC HOLDINGS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: PHC HOLDINGS CORPORATION
- Current Assignee: PHC HOLDINGS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2014-134778 20140630
- International Application: PCT/JP2015/068723 WO 20150629
- International Announcement: WO2016/002728 WO 20160107
- Main IPC: G01N35/00
- IPC: G01N35/00

Abstract:
A substrate for sample analysis on which transfer of a liquid is to occur with rotational motion includes: a substrate having a rotation axis; a first chamber being located in the substrate and having a first space for retaining a liquid and magnetic particles; a second chamber being located in the substrate and having a second space for retaining the liquid to be discharged from the first chamber; a channel being located in the substrate and having a path connecting the first chamber and the second chamber; and a magnet being located in the substrate and near the first space in the substrate for capturing the magnetic particles in the first chamber.
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