Invention Grant
- Patent Title: Semiconductor device and AC resistance measuring system including the same
-
Application No.: US14853834Application Date: 2015-09-14
-
Publication No.: US10539600B2Publication Date: 2020-01-21
- Inventor: Masato Hirai , Siewling Lim
- Applicant: Renesas Electronics Corporation
- Applicant Address: JP Tokyo
- Assignee: RENESAS ELECTRONICS CORPORATION
- Current Assignee: RENESAS ELECTRONICS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2014-194718 20140925
- Main IPC: G01R27/14
- IPC: G01R27/14 ; G01R31/28 ; H02J3/00

Abstract:
Provided is a semiconductor device including: an AC voltage generation unit that generates an AC voltage having an amplitude according to a control signal; a resistance element provided in series with a measurement target, the AC voltage being applied to the resistance element; a voltage detecting unit that detects that a difference voltage between two ends of the resistance element has reached a specified voltage; and a control unit that outputs the control signal to the AC voltage generation unit to cause the AC voltage generation unit to generate the AC voltage so that the difference voltage reaches the specified voltage, based on a detection result of the voltage detecting unit.
Public/Granted literature
- US20160091543A1 SEMICONDUCTOR DEVICE AND AC RESISTANCE MEASURING SYSTEM INCLUDING THE SAME Public/Granted day:2016-03-31
Information query