Invention Grant
- Patent Title: X-ray detection of X-ray incident fringe pattern in phase-contrast and/or dark-field X-ray imaging
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Application No.: US16335819Application Date: 2018-08-03
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Publication No.: US10539688B2Publication Date: 2020-01-21
- Inventor: Roger Steadman Booker , Ewald Roessl , Walter Ruetten
- Applicant: KONINKLIJKE PHILIPS N.V.
- Applicant Address: NL Eindhoven
- Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee Address: NL Eindhoven
- Agent Larry Liberchuk
- Priority: EP17187475 20170823
- International Application: PCT/EP2018/071847 WO 20180803
- International Announcement: WO2019/038113 WO 20190228
- Main IPC: G01T1/20
- IPC: G01T1/20 ; G01T1/208 ; G01T1/24

Abstract:
In a conventional phase-contrast X-ray imaging system, a source grating G0 generates an array of partially coherent line sources which illuminate an object and thereafter phase grating G1. The periodicity in the phase grating is self-imaged at certain instances further away from the X-ray source and sampled by a mechanically movable third absorptive analyzer grating G2 before the demodulated fringe intensity is detected by a conventional X-5 ray detector. This application proposes to directly demodulate the fringe intensity using a structured scintillator having a plurality of slabs in alignment with sub-pixels of an optical detector layer, in combination with electronic signal read-out approaches. Therefore, a mechanically movable third absorptive analyzer grating G2 can be omitted from a phase-contrast X-ray imaging system.
Public/Granted literature
- US20190219713A1 X-RAY DETECTION OF X-RAY INCIDENT FRINGE PATTERN IN PHASE-CONTRAST AND/OR DARK-FIELD X-RAY IMAGING Public/Granted day:2019-07-18
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