Invention Grant
- Patent Title: Comparison system, comparison apparatus, comparison method, and program
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Application No.: US15549223Application Date: 2016-02-25
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Publication No.: US10540548B2Publication Date: 2020-01-21
- Inventor: Rui Ishiyama , Toru Takahashi , Yuta Kudo
- Applicant: NEC CORPORATION
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: JP Minato-ku, Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2015-038682 20150227
- International Application: PCT/JP2016/055681 WO 20160225
- International Announcement: WO2016/136900 WO 20160901
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06F16/51 ; G06F17/18 ; G06K9/62 ; G06Q50/04

Abstract:
A comparison system includes a portable terminal including image capturing unit configured to capture a comparison image of a predetermined comparison region of a comparison object; and a server including comparison unit configured to compare the comparison object with a registered object on the basis of a statistical value for the luminance value of pixels in a registered image of the registered object, the pixels of the registered image existing at pixel positions corresponding to pixel positions estimated to be generating specular reflection in the comparison image captured by the portable terminal.
Public/Granted literature
- US20180039830A1 COMPARISON SYSTEM, COMPARISON APPARATUS, COMPARISON METHOD, AND PROGRAM Public/Granted day:2018-02-08
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