Invention Grant
- Patent Title: Inspection method and inspection apparatus
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Application No.: US16145643Application Date: 2018-09-28
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Publication No.: US10540561B2Publication Date: 2020-01-21
- Inventor: Makoto Yabe , Hiroteru Akiyama , Takafumi Inoue
- Applicant: NUFLARE TECHNOLOGY, INC.
- Applicant Address: JP Yokohama-shi
- Assignee: NUFLARE TECHNOLOGY, INC.
- Current Assignee: NUFLARE TECHNOLOGY, INC.
- Current Assignee Address: JP Yokohama-shi
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2017-188970 20170928
- Main IPC: G03F7/20
- IPC: G03F7/20 ; G06K9/32 ; G06T7/00 ; G03F1/42 ; G03F1/84 ; G03F9/00

Abstract:
An inspection method includes a rough alignment process of acquiring optical images of first and second patterns previously set to confirm whether a position misalignment amount in a rotation direction of a sample with respect to an X or Y direction is equal to or smaller than a first acceptable value, and conforming whether the position misalignment amount is equal to or smaller than the first acceptable value on the basis of an acquisition result, and a fine alignment process of acquiring optical images of third patterns positioned on different corners of a rectangular frame constituted of four sides along the X or Y direction on an optical image of the sample and rotating a stage until a position misalignment amount detected based on the optical images of the third patterns becomes equal to or smaller than a second acceptable value being smaller than the first acceptable value.
Public/Granted literature
- US20190095740A1 INSPECTION METHOD AND INSPECTION APPARATUS Public/Granted day:2019-03-28
Information query
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