Invention Grant
- Patent Title: Method and apparatus for determining a planar surface
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Application No.: US15900015Application Date: 2018-02-20
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Publication No.: US10540823B2Publication Date: 2020-01-21
- Inventor: Yi Xu , Hui Zhou
- Applicant: BEIJING JINGDONG SHANGKE INFORMATION TECHNOLOGY CO., LTD. , JD.com AMERICAN TECHNOLOGIES CORPORATION
- Applicant Address: CN Beijing US CA Santa Clara
- Assignee: Beijing Jingdong Shangke Information Technology Co., Ltd.,JD.com American Technologies Corporation
- Current Assignee: Beijing Jingdong Shangke Information Technology Co., Ltd.,JD.com American Technologies Corporation
- Current Assignee Address: CN Beijing US CA Santa Clara
- Agency: RatnerPrestia
- Main IPC: G06T19/20
- IPC: G06T19/20 ; G06T15/20 ; G06T17/20 ; G06T7/73

Abstract:
Embodiments of the present disclosure disclose a method and an apparatus for determining a planar surface. A specific embodiment of the method comprises: determining, from obtained images of the environment that include a to-be-determined planar surface, feature points belonging to the to-be-determined planar surface; judging whether the number of the feature points belonging to the to-be-determined planar surface is smaller than a preset number threshold; if yes, generating first prompt information for prompting a user to add feature points on the to-be-determined planar surface; obtaining at least two first images including the added feature points; and in response to the number of the feature points belonging to the to-be-determined planar surface in the first images being no less than the preset number threshold, reconstructing the to-be-determined planar surface based on the first images so as to determine a location and an orientation of the to-be-determined planar surface. This embodiment implements reconstruction of a weakly-textured or texture-less planar surface.
Public/Granted literature
- US20190259215A1 METHOD AND APPARATUS FOR DETERMINING A PLANAR SURFACE Public/Granted day:2019-08-22
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