Invention Grant
- Patent Title: FinFET-based ESD devices and methods for forming the same
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Application No.: US16231764Application Date: 2018-12-24
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Publication No.: US10546850B2Publication Date: 2020-01-28
- Inventor: Wun-Jie Lin , Ching-Hsiung Lo , Jen-Chou Tseng , Han-Jen Yang , Arabinda Das
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Slater Matsil, LLP
- Main IPC: H01L27/02
- IPC: H01L27/02 ; H01L27/088 ; H01L29/45 ; H01L29/417 ; H01L21/8234 ; H01L29/78 ; H01L29/423 ; H01L29/08

Abstract:
A semiconductor device includes semiconductor fins on semiconductor strips on a substrate. The semiconductor fins are parallel to each other. A gate stack is over the semiconductor fins, and a drain epitaxy semiconductor region is disposed laterally from a side of the gate stack and on the semiconductor strips. A first dielectric layer is over the substrate, and the first dielectric layer has a first metal layer. A second dielectric layer is over the first dielectric layer, and the second dielectric layer has a second metal layer. Vias extend from the second metal layer and through the first dielectric layer, and the vias are electrically coupled to the drain epitaxy semiconductor region.
Public/Granted literature
- US20190148357A1 FinFET-Based ESD Devices and Methods for Forming the Same Public/Granted day:2019-05-16
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