Invention Grant
- Patent Title: X-ray CT apparatus and scanning method
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Application No.: US15535859Application Date: 2016-01-13
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Publication No.: US10548539B2Publication Date: 2020-02-04
- Inventor: Hirohisa Izumo
- Applicant: HITACHI, LTD.
- Applicant Address: JP Tokyo
- Assignee: HITACHI, LTD.
- Current Assignee: HITACHI, LTD.
- Current Assignee Address: JP Tokyo
- Agency: Cooper & Dunham LLP
- Priority: JP2015-010871 20150123
- International Application: PCT/JP2016/050755 WO 20160113
- International Announcement: WO2016/117418 WO 20160728
- Main IPC: A61B6/03
- IPC: A61B6/03 ; A61B6/04 ; A61B6/00 ; G01N23/046

Abstract:
According to an X-ray CT apparatus and a scanning method of the present invention, in order to efficiently create an image used for diagnosis, an operator selects a desired part from a part selection GUI before main scanning by using an ROI object imitating a shape of each part, held in a storage device, and thus the ROI object can be disposed on a scanogram image, in which setting information corresponding to a part is set for the ROI object in advance, a region of interest associated with the part is set, main scanning is performed under conditions associated with the set region of interest, and an image is reconstructed on the basis of X-ray information obtained through the main scanning.
Public/Granted literature
- US20170347974A1 X-RAY CT APPARATUS AND SCANNING METHOD Public/Granted day:2017-12-07
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