Invention Grant
- Patent Title: Method, kit and target for multimode 3D imaging systems
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Application No.: US15678230Application Date: 2017-08-16
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Publication No.: US10551164B2Publication Date: 2020-02-04
- Inventor: Luc Cournoyer , Michel Picard
- Applicant: NATIONAL RESEARCH COUNCIL OF CANADA
- Applicant Address: CA Ottawa, Ontario
- Assignee: National Research Council of Canada
- Current Assignee: National Research Council of Canada
- Current Assignee Address: CA Ottawa, Ontario
- Agent Kenneth Murphy
- Main IPC: G01B11/00
- IPC: G01B11/00 ; G01B11/03 ; G01C11/00 ; G01C15/06

Abstract:
A technique for acquiring target's coordinates for industrial dimensional metrology involves a target that serves both as a 2D contrast target and a 3D contact target, and a metrology tool. The target has proximal and distal surfaces, at least some of which being primarily flat and facing a common normal direction. At least 3 mm separate the proximal and distal surfaces in the normal direction. Reflectivity factors of the distal and proximal surfaces differ by at least 20%. Risers connecting pairs of the proximal and distal surfaces are sufficiently undercut so that none of the risers are in view at nominal viewing angles. At least two reference edges are defined where risers meet proximal surfaces. The tool has meeting features for registration with the edges and primarily flat surfaces, in at least two registered positions, to permit a retroreflector of the tool to acquire coordinates the target centre.
Public/Granted literature
- US20180238677A1 METHOD, KIT AND TARGET FOR MULTIMODE 3D IMAGING SYSTEMS Public/Granted day:2018-08-23
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