Invention Grant
- Patent Title: Global analysis peak fitting for chemical spectroscopy data
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Application No.: US15082922Application Date: 2016-03-28
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Publication No.: US10551247B1Publication Date: 2020-02-04
- Inventor: Mark Van Benthem , James A. Ohlhausen
- Applicant: National Technology & Engineering Solutions of Sandia, LLC
- Applicant Address: US NM Albuquerque
- Assignee: National Technology & Engineering Solutions of Sandia, LLC
- Current Assignee: National Technology & Engineering Solutions of Sandia, LLC
- Current Assignee Address: US NM Albuquerque
- Agent Helen S. Baca
- Main IPC: G01J3/42
- IPC: G01J3/42 ; G01N21/31 ; G01N21/64 ; G01N23/083

Abstract:
The present invention relates to methods for analyzing a chemical sample. For instance, the methods herein allow for global analysis of spectroscopy data in order to extract useful chemical properties from complicated multidimensional data. Such analysis can optionally employ data compression to further expedite computer-implemented computation. In particular, the methods herein provide global analysis of data matrices explained by both linear and non-linear terms.
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