A method of evaluating a device includes a first electric circuit acting as a noise source and a second electric circuit which is likely to malfunction due to a noise signal. The method includes: obtaining malfunction frequency characteristics indicating magnitudes of a threshold noise signal causing malfunction of the second electric circuit; obtaining internal noise arrival frequency characteristics indicating magnitudes of an internal noise signal arriving at the second electric circuit from the first electric circuit; and comparing the malfunction frequency characteristics with the internal noise arrival frequency characteristics.