Invention Grant
- Patent Title: Data processing apparatus, method of obtaining characteristic of each pixel and method of data processing, and program
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Application No.: US15516777Application Date: 2015-07-10
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Publication No.: US10551510B2Publication Date: 2020-02-04
- Inventor: Takuto Sakumura , Yasukazu Nakaye , Yuji Tsuji , Koichi Kajiyoshi , Takeyoshi Taguchi , Kazuyuki Matsushita
- Applicant: RIGAKU CORPORATION
- Applicant Address: JP Tokyo
- Assignee: RIGAKU CORPORATION
- Current Assignee: RIGAKU CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2014-217751 20141024
- International Application: PCT/JP2015/069924 WO 20150710
- International Announcement: WO2016/063586 WO 20160428
- Main IPC: G01T1/17
- IPC: G01T1/17

Abstract:
Provided are a data processing apparatus a method of obtaining the characteristic of each pixel and a method of data processing, and a program. A data processing apparatus 100 to correct X-ray intensity data measured by a pixel detector includes a characteristic storage unit 130 to store the characteristic of each pixel in a specific detector, a correction table generation unit 120 to apply a measurement condition input as that in measurement by a specific detector and a value expressing the characteristic of each pixel to an approximate formula expressing the count value of each pixel and to generate a correction table for the specific detector using the calculation result of the approximate formula, and a correction unit 160 to correct the X-ray intensity data measured by the specific detector using the generated correction table.
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