Invention Grant
- Patent Title: Processing chamber hardware fault detection using spectral radio frequency analysis
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Application No.: US16365424Application Date: 2019-03-26
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Publication No.: US10553397B2Publication Date: 2020-02-04
- Inventor: Sathyendra K. Ghantasala , Vijayakumar C. Venugopal , Hyun-Ho Doh
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Schwabe, Williamson & Wyatt, P.C.
- Main IPC: H01J37/32
- IPC: H01J37/32 ; G01R27/04

Abstract:
A method of assigning faults to a processing chamber is described. Some embodiments include applying a radio frequency (RF) signal to a processing chamber to stimulate resonance in the chamber, measuring resonances of the applied RF signal in the chamber, extracting a fingerprint from the measured resonances, comparing the extracted fingerprint to a library of fingerprints, assigning a similarity index to combinations of the extracted fingerprint with at least one fingerprint in the fingerprint library, comparing each similarity index to a threshold, and if the similarity is greater than a threshold, then assigning a fault to the processing chamber using the library fingerprint.
Public/Granted literature
- US20190221401A1 PROCESSING CHAMBER HARDWARE FAULT DETECTION USING SPECTRAL RADIO FREQUENCY ANALYSIS Public/Granted day:2019-07-18
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