Invention Grant
- Patent Title: Method for fabricating contact electrical fuse
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Application No.: US15949084Application Date: 2018-04-10
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Publication No.: US10553534B2Publication Date: 2020-02-04
- Inventor: Ming-Te Wei , Chun-Hsien Lin
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsin-Chu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu
- Priority: CN201610555077 20160714
- Main IPC: H01L23/525
- IPC: H01L23/525 ; H01L23/532 ; H01L21/768 ; H01L21/033 ; H01L21/311 ; H01L21/8234 ; H01L23/522

Abstract:
A method for fabricating semiconductor device includes the steps of first forming a first dielectric layer on a substrate, in which a first conductor is embedded within the first dielectric layer. Next, a second dielectric layer is formed on the first dielectric layer, part of the second dielectric layer is removed to form a contact hole, and a lateral etching process is conducted to expand the contact hole to form a funnel-shaped opening. Next, a metal layer is formed in the funnel-shaped opening, and the metal layer is planarized to form a second conductor.
Public/Granted literature
- US20180233449A1 METHOD FOR FABRICATING CONTACT ELECTRICAL FUSE Public/Granted day:2018-08-16
Information query
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