The present disclosure relates to a method that includes applying a first condition to a photovoltaic (PV) device, and applying a second condition to the PV device, where the first condition results in a first luminescing of a surface of the PV device at a first intensity, the second condition results in a second luminescing of the surface at a second intensity, measuring the first intensity using a detector to create a first representation of the surface, measuring the second intensity using the detector to create a second representation of the surface, and comparing the first representation with the second representation to create a third representation of the surface that identifies a defect in the surface, if present.