Invention Grant
- Patent Title: Method and system for measuring interferometric visibility of telescopic signals having imperfect quantum entanglement
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Application No.: US15979020Application Date: 2018-05-14
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Publication No.: US10554312B2Publication Date: 2020-02-04
- Inventor: Siddhartha Santra , Brian T. Kirby , Vladimir S. Malinovsky , Michael Brodsky
- Applicant: U.S. Army Research Laboratory
- Applicant Address: US DC Washington
- Assignee: The United States of America as represented by the Secretary of the Army
- Current Assignee: The United States of America as represented by the Secretary of the Army
- Current Assignee Address: US DC Washington
- Agent Eric B. Compton
- Main IPC: H04B10/70
- IPC: H04B10/70 ; G02B23/04 ; G06F17/16 ; G06F17/15 ; G06F17/14

Abstract:
Methods and systems for measuring interferometric visibility of telescopic signals using resources having imperfect quantum entanglement are disclosed. The novel methodology employed by embodiments of the present invention takes into account the difficulty in creating entanglement between distance telescopes, and describes how to incorporate problems associated with distributing quantum entanglement into the measurement procedure. This allows the distance that two telescopes in an optical array are spaced apart to be increased while still interacting.
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