Invention Grant
- Patent Title: Measuring system and measuring method for calibrating an antenna array
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Application No.: US15453551Application Date: 2017-03-08
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Publication No.: US10554316B2Publication Date: 2020-02-04
- Inventor: Hendrik Bartko
- Applicant: Rohde & Schwarz GmbH & Co. KG
- Applicant Address: DE Munich
- Assignee: ROHDE & SCHWARZ GMBH & CO. KG
- Current Assignee: ROHDE & SCHWARZ GMBH & CO. KG
- Current Assignee Address: DE Munich
- Agency: Ditthavong & Steiner, P.C.
- Main IPC: H04B17/12
- IPC: H04B17/12 ; G01R29/10

Abstract:
A measuring system for calibrating an antenna array is provided. A parameter setting unit modifies an input signal of a first antenna or a first antenna group, using operating parameters. A signal generator generates a first measuring signal and provides it to the parameter setting unit and to a second antenna or a second antenna group of the antenna array. A measuring antenna receives a second measuring signal composed of a signal emitted by the first antenna or first antenna group and a signal emitted by the second antenna or second antenna group. A power meter measures the power of the second measuring signal. An evaluation device determines a measured interference signal from the measured power of the second measuring signal, and preferably also determines the operating parameters used by the parameter setting unit based upon the measured interference signal and position information.
Public/Granted literature
- US20180262279A1 MEASURING SYSTEM AND MEASURING METHOD FOR CALIBRATING AN ANTENNA ARRAY Public/Granted day:2018-09-13
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