Invention Grant
- Patent Title: Apparatus and method for large field-of-view measurements of geometric distortion and spatial uniformity of signals acquired in imaging systems
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Application No.: US15589557Application Date: 2017-05-08
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Publication No.: US10555715B2Publication Date: 2020-02-11
- Inventor: Richard P. Mallozzi , Joshua R. Levy
- Applicant: THE PHANTOM LABORATORY, INCORPORATED
- Applicant Address: US NY Greenwich
- Assignee: THE PHANTOM LABORATORY, INCORPORATED
- Current Assignee: THE PHANTOM LABORATORY, INCORPORATED
- Current Assignee Address: US NY Greenwich
- Agency: Heslin Rothenberg Farley & Mesiti PC
- Agent Matthew M. Hulihan
- Main IPC: A61B6/00
- IPC: A61B6/00

Abstract:
An apparatus and method for imaging quality assessment of an imaging system employs an aggregate phantom and a processor for imaging analysis. The aggregate phantom includes a plurality of self-contained sections configured to be moved independently and re-assembled in the imaging system. Each section includes fiducial features of known relative location. The processor: quantitatively determines location of the fiducial features within an image of the aggregate phantom; compares the determined location within the image to the known relative location of the fiducial features to produce a distortion field; and distinguishes between actual geometric distortion of the imaging system and rigid-body transformations of sections of the aggregate phantom, in the distortion field. For extended fields-of-view, the aggregate phantom may be repositioned, and sets of images combined to determine a distortion field of the extended image. A method employing virtual features for measuring spatial uniformity of an acquired signal, is also provided.
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