Invention Grant
- Patent Title: Thin film strain gauge
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Application No.: US16518124Application Date: 2019-07-22
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Publication No.: US10557760B2Publication Date: 2020-02-11
- Inventor: Daniel E. Shapiro
- Applicant: Strain Measurement Devices, Inc.
- Applicant Address: US CT Wallingford
- Assignee: STRAIN MEASUREMENT DEVICES, INC.
- Current Assignee: STRAIN MEASUREMENT DEVICES, INC.
- Current Assignee Address: US CT Wallingford
- Agency: Cantor Colburn LLP
- Main IPC: G01L1/00
- IPC: G01L1/00 ; G01L1/22 ; G01B7/00

Abstract:
A strain gauge includes: a substrate; a dielectric layer on the substrate; a thin film electrical circuit on the dielectric layer and having input/output terminals; another layer disposed on the electrical circuit; the dielectric layer forming a first seal on one side of the electrical circuit, the another layer forming a second seal on a second side of the electrical circuit, the first and second seals having structure such that: in a first instance prior to exposure of the strain gauge to an autoclave cycle, the electrical circuit is productive of a first output voltage in response to a first input voltage; and in a second instance subsequent to exposure of the strain gauge to at least 10 autoclave cycles, the electrical circuit is productive of a second output voltage in response to a second input voltage, the first and second input voltages being equal, and the first and second output voltages being equal within a 15% shift in zero offset.
Public/Granted literature
- US20190353541A1 THIN FILM STRAIN GAUGE Public/Granted day:2019-11-21
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