Invention Grant
- Patent Title: Method and apparatus for discriminating resin
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Application No.: US15877942Application Date: 2018-01-23
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Publication No.: US10557808B2Publication Date: 2020-02-11
- Inventor: Hiroaki Furukawa
- Applicant: Shimadzu Corporation
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: Maier & Maier, PLLC
- Main IPC: G01N23/02
- IPC: G01N23/02 ; G01N23/2206 ; G01N23/223

Abstract:
A resin discriminating apparatus includes an X-ray tube which emits X-rays, an X-ray detector which detects X-rays emitted from a sample irradiated with X-rays, a data processing section which creates a spectrum on the basis of a detection signal obtained by the X-ray detector, a peak extraction section which extracts a spectral line due to Compton scattering and a spectral line due to Rayleigh scattering derived from a target element of the X-ray tube on the spectrum, and obtains a peak intensity, and a discrimination section which calculates a scattering intensity ratio which is a ratio of the Rayleigh scattering intensity to the Compton scattering intensity and discriminates the type of resin contained in the sample from the scattering intensity ratio.
Public/Granted literature
- US20190227009A1 Method and Apparatus for Discriminating Resin Public/Granted day:2019-07-25
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