Invention Grant
- Patent Title: Probe pin and inspection device including probe pin
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Application No.: US15759244Application Date: 2017-01-05
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Publication No.: US10557867B2Publication Date: 2020-02-11
- Inventor: Hirotada Teranishi , Takahiro Sakai
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto-shi
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto-shi
- Agency: Metrolex IP Law Group, PLLC
- Priority: JP2016-026060 20160215
- International Application: PCT/JP2017/000172 WO 20170105
- International Announcement: WO2017/141561 WO 20170824
- Main IPC: G01R1/067
- IPC: G01R1/067 ; H01R13/24

Abstract:
A probe pin includes an elastic hollow cylinder that expands and contracts along a central axis, a conductive first plunger extending in the cylinder along the central axis from a first end of the cylinder, and a conductive second plunger extending in the cylinder along the central axis from a second end of the cylinder. The first and second plungers are coupled together in the cylinder in a manner movable relative to each other along the central axis. The first plunger includes a first plunger body contained in the cylinder, and a first terminal connected to the first plunger body and located outside the cylinder. The second plunger includes a second plunger body contained in the cylinder, and a second terminal connected to the second plunger body and located outside the cylinder. The first plunger body includes a slope that tapers in a direction from an outer side toward an inner side of the cylinder, comes in contact with the second plunger body inside the cylinder, and is urged in a direction crossing the central axis by relative movement of the first and second plungers. The first plunger body includes a deformable elastic portion between the first terminal and the slope.
Public/Granted literature
- US20180340957A1 PROBE PIN AND INSPECTION DEVICE INCLUDING PROBE PIN Public/Granted day:2018-11-29
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