Methods and systems for a universal device multi-function test apparatus are provided. Specifically, the universal device multi-function test apparatus is configured to receive multiple device types, manufacturers, and/or models attached to a nest via an interface module. The device can then be subjected to a battery of tests in a unified and controlled test environment. Information related to the initiated tests, even including results, may be associated with the device and stored in memory, written to the device, and/or forwarded for further processing/repair operations.