Invention Grant
- Patent Title: System for image reconstruction using a known pattern
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Application No.: US15795150Application Date: 2017-10-26
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Publication No.: US10558029B2Publication Date: 2020-02-11
- Inventor: Ben Leshem , Itai Hayut , Erez Na'Aman , Eran Small
- Applicant: Scopio Labs Ltd.
- Applicant Address: IL Tel Aviv
- Assignee: Scopio Labs Ltd.
- Current Assignee: Scopio Labs Ltd.
- Current Assignee Address: IL Tel Aviv
- Agency: Wilson Sonsini Goodrich & Rosati
- Main IPC: G16H30/40
- IPC: G16H30/40 ; G02B21/36 ; G01N21/17 ; G01N21/25 ; G02B21/34 ; G02B21/14

Abstract:
Disclosed herein are systems and methods for constructing an image of a sample using a plurality of images acquired under multiple illumination conditions. In some cases, a microscope may include an image capture device, an illumination assembly, and a processor configured to acquire a plurality of images of a sample and a fiducial marker under a plurality of different illumination conditions and to reconstruct a high resolution image in response to the plurality of images. The disclosure also provides a method for generating a high resolution image of a sample comprising acquiring a plurality of images of a sample and a fiducial marker under a plurality of different illumination conditions and reconstructing the high resolution image in response to the plurality of images.
Public/Granted literature
- US20180120553A1 System for image reconstruction using a known pattern Public/Granted day:2018-05-03
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