High recall additive pattern recognition for image and other applications
Abstract:
A computer-implemented method includes selecting a kernel and kernel parameters for a first Support Vector Machine (SVM) model, testing the first SVM model on a feature matrix T of n feature vectors of length m to produce false positive (FP) data set and false negative (FN) data set by a computer processor, wherein n and m are integer numbers, automatically removing feature vectors corresponding to the FP data set from the feature matrix T by the computer processor to produce a feature matrix T_best of size (n-size(FN))*m, retraining the first SVM model on the feature matrix T_best to produce a second SVM model, and checking if a ratio (T_best sample number)/(SVM support vector number) is above a threshold for the second SVM model on T_best. If the ratio is above the threshold, SVM predictions are performed using the second SVM model on the feature matrix T_best.
Information query
Patent Agency Ranking
0/0