Invention Grant
- Patent Title: Statistical pattern generation for information extraction
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Application No.: US14947002Application Date: 2015-11-20
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Publication No.: US10558926B2Publication Date: 2020-02-11
- Inventor: Wen-lian Hsu
- Applicant: Academia Sinica
- Applicant Address: TW Taipei
- Assignee: ACADEMIA SINICA
- Current Assignee: ACADEMIA SINICA
- Current Assignee Address: TW Taipei
- Agency: WPAT, PC
- Main IPC: G06N5/04
- IPC: G06N5/04 ; G06F17/27 ; G06N5/02

Abstract:
An apparatus for extracting selected information from a set of symbols includes said alignment module is configured to retrieve test patterns from a symbol input, and to attempt alignment of test patterns with a canonical pattern. Successful alignment between a particular test pattern and said canonical pattern indicates of existence of information of interest in a particular candidate pattern. Upon detection of a successful alignment, the alignment module passes information concerning the test pattern to a user. Additionally, in response to detecting an unsuccessful attempt to align the first test pattern and the canonical pattern, said alignment module passes, to said user, information concerning the first test pattern.
Public/Granted literature
- US20160148119A1 STATISTICAL PATTERN GENERATION FOR INFORMATION EXTRACTION Public/Granted day:2016-05-26
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