Invention Grant
- Patent Title: Selective deposition with atomic layer etch reset
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Application No.: US15581951Application Date: 2017-04-28
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Publication No.: US10559461B2Publication Date: 2020-02-11
- Inventor: Kapu Sirish Reddy , Meliha Gozde Rainville , Nagraj Shankar , Dennis M. Hausmann , David Charles Smith , Karthik Sivaramakrishnan , David W. Porter
- Applicant: Lam Research Corporation
- Applicant Address: US CA Fremont
- Assignee: LAM RESEARCH CORPORATION
- Current Assignee: LAM RESEARCH CORPORATION
- Current Assignee Address: US CA Fremont
- Agency: Weaver Austin Villeneuve & Sampson
- Main IPC: C23C16/44
- IPC: C23C16/44 ; H01L21/02 ; H01L21/67 ; C23C16/455 ; C23C16/52 ; C23C16/04 ; C23F1/02 ; C23F1/08

Abstract:
Methods are provided for conducting a deposition on a semiconductor substrate by selectively depositing a material on the substrate. The substrate has a plurality of substrate materials, each with a different nucleation delay corresponding to the material deposited thereon. Specifically, the nucleation delay associated with a first substrate material on which deposition is intended is less than the nucleation delay associated with a second substrate material on which deposition is not intended according to a nucleation delay differential, which degrades as deposition proceeds. A portion of the deposited material is etched to reestablish the nucleation delay differential between the first and the second substrate materials. The material is further selectively deposited on the substrate.
Public/Granted literature
- US20180308680A1 SELECTIVE DEPOSITION WITH ATOMIC LAYER ETCH RESET Public/Granted day:2018-10-25
Information query
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