Dual pocket approach in PFETs with embedded SI-GE source/drain
Abstract:
A p-type metal oxide semiconductor field effect transistor (PFET) includes a p-type silicon substrate and an n-type well formed in the p-type silicon substrate. The PFET also comprises a p-type source formed in the n-type well, a p-type drain formed in the n-type well, and dual pockets implanted in the n-type well and coupled to the source and drain. The dual pockets comprise a first pocket with first arsenic n-type dopants and a second pocket with second arsenic n-type dopants.
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